Physics controls

THIN FILM

Optical materials

Film thickness450 nm

Incident medium index n₀1.00

Film refractive index n₁1.33

Substrate index n₂1.00

Angle of incidence25°

Polarisation

Incoherent thick-film limitApplies a smooth coherence-visibility fade centred on 5 µm rather than an abrupt switch.

Film topology

Thickness field

Turbulence1.2

Flow speed0.8

Touch ripple strength220 nm

Centre-point spectrum

The graph samples reflected intensity from 380–700 nm at the centre of the film.

Projection & accessibility

Readable typographyWider spacing and sturdy system fonts

Reduced sensory motionSlower fades and gentler ripple decay

Low-stimulus focus modeFlat surfaces, no glow or moving field animation, and 48 px controls

Interference sonificationHear local constructive and destructive intensity beneath the pointer

Render quality

Alt + pointer activates a teacher spotlight. H hides controls, Space pauses, F enters fullscreen.

Classroom outputs

Optical path difference0 nm

Dominant sample—

Phase condition—

Fringe spacing—

Coherence—

Click or drag through the film to perturb its thickness. No network connection is used.

Wave Interference & Iridescence Evidence Sheet

Made by Matt · Physical optics and Sci–Art investigation

Name: __________________________

Date: _______________ Class: ________

Simulation mode

Primary parameter

Material / source

Live diagnostic

Explain the pattern: Identify where constructive and destructive interference occur. Describe how changing thickness, wavelength, refractive index, source separation or incidence angle changes the observed pattern. Use the terms path difference, phase and superposition.